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LTC1099
5
PIN FUNCTIONS
UU
U
VIN (Pin 1): Analog Input.
DB0 to DB3 (Pins 2 to 5): Data Outputs. DB0 = LSB.
WR/RDY (Pin 6): WR/RDY is an input when M0DE = VCC.
Falling edge of WR switches internal S/H to hold then
starts conversion. WR/RDY is an open drain output (active
pull-down) when M0DE = GND. RDY goes low at start of
conversion and pull-down is turned off when conversion
is complete. Resistive pull-up is usually used in this mode.
MODE (Pin 7): WR-RD when MODE = VCC. RD when
M0DE = GND. No internal pull-down.
RD (Pin 8): A Low on RD with CS Low Activates Three-
State Outputs. With MODE = GND and CS low, the falling
edge of RD switches internal S/H to hold and starts
conversion.
INT (Pin 9): Output that goes low when the conversion in
process is complete and goes high after data is read.
GND (Pin 10): Ground Connection.
REF– (Pin 11): Low Reference Potential (Analog Ground).
REF+ (Pin 12): High Reference Potential. VREF = Full Scale
= (REF+) – (REF–).
CS (Pin 13): Chip Select. When high, data outputs are high
impedance and all inputs are ignored.
DB4 to DB7 (Pins 14 to 17): Data Outputs. DB7 = MSB.
OFL (Pin 18): Overflow Output. Goes low when VIN > VREF.
TC (Pin 19): User Adjustable Conversion Time.
VCC (Pin 20): Positive Supply. 4.75V ≤ VCC ≤ 5.25V.
TEST CIRCUITS
RD
CS
CL
DATA
OUT
VCC
1k
RD
CS
CL
DATA
OUT
VCC
t1H
tr = 20ns, CL = 10pF
t0H
tr = 20ns, CL = 10pF
GND
RD
VCC
GND
V0H
DATA OUT
VCC
V0L
DATA OUT
tr
t1H
t0H
90%
50%
10%
1099 F01
1k
Figure 1. Three-State Test Circuit
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